číslo produktu:155830
rezervujRok vydania: 1998
Vydavateľ: Springer
V prípade dlhodobého záujmu si urobte REZERVÁCIU a my vám odložíme žiadaný kus.
Scanning Electron Microscopy provides a description of the physics of electron-probe formation and of electron-specimen interactions. The different imaging and analytical modes using secondary and backscattered electrons, electron-beam-induced currents, X-ray and Auger electrons, electron channelling effects, and cathodoluminescence are discussed to evaluate specific contrasts and to obtain quantitative information.
Vydavateľstvo: Springer
Rok vydania: 1998
Vydanie: 2nd comple
ISBN: 978-3-540-63976-3
(9783540639763)
Väzba: tvrdá