číslo produktu:138680
rezervujElectron Energy-Loss Spectroscopy in the Electron Microscope
Rok vydania: 1996
Vydavateľ: Springer
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O knihe:
The Second Edition explores several new applications of EELS developed during the last ten years. Chapters include recent progress in parallel-recording detectors and image-filtering systems as well as spectral fine structure. This edition also features updated computer programs which will perform spectrum deconvolution and compute partial ionization cross-sections.
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