číslo produktu:156328
rezervujRok vydania: 1993
Vydavateľ: Springer
V prípade dlhodobého záujmu si urobte REZERVÁCIU a my vám odložíme žiadaný kus.
This is the first comprehensive volume on electron beam testing for integrated circuits. Including introductory material, a guide to fundamentals, and an implementational section, the work will serve as a complete reference for both experienced practitioners as well as those unfamiliar with the technology.
Väzba: tvrdá